Dominic Plunkett is chief technology officer at XJTAG.
1 results found for Dominic Plunkett , displaying items 1 - 1
November 2005[Point of View] Designing Chips For JTAG Testing
Boundary-scan testing offers a solution to the challenges presented by high component density, increasing use of area array packages, and the prevalence of complex, multilayer PCBs, which make test probe access and bed-of-nails testing impossible for many new board designs. Modern JTAG test gear has powerful capabilities that add value to product development, production, and field maintenance. Graphical user interfaces along with powerful test generation and troubleshooting...
